Extended noise analysis — a novel tool for reliability screening-Reference-Cited by-同舟云学术

Extended noise analysis — a novel tool for reliability screening

Published:1998-06 Issue:6-8 Volume:38 Page:1193-1198
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Härtler Gisela,Golze Ute,Paschke Katrin

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Noise as a Diagnostic Tool for the Reliability Improvement of Microelectronic Components for Information Technology and Enviromental Control,1996

2. A study of optical noise measurement as a reliability estimation for laser diodes;Yisong;Microelectron. Reliab.,1995

3. Extended Noise Analysis;Härtler,1997

4. Chaos Fractals, and Noise;Lasota,1994

5. Transition Intensities and Noise Spectra in Submicron MOSFETs;Härtler,1997

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1. Effect of series and parallel resistance on low-frequency noise level in semiconductor lasers;SPIE Proceedings;2005-01-31

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3. An improved method and experimental results of noise used as reliability estimation for semiconductor lasers;Optics & Laser Technology;2003-09

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5. Electrical noise as a reliability indicator in electronic devices and components;IEE Proceedings - Circuits, Devices and Systems;2002-02-01