Correlation between the g-r noise in semiconductor lasers and device reliability
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Published:2004-05-12
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ISSN:0277-786X
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Container-title:Materials, Active Devices, and Optical Amplifiers
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Author:
Hu Guijun1,
Sun Yadong1,
Zhang Hongmei1,
Li Jing1,
Shi Yingxue1,
Shi Jiawei1