An improved method and experimental results of noise used as reliability estimation for semiconductor lasers-Reference-Cited by-同舟云学术

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An improved method and experimental results of noise used as reliability estimation for semiconductor lasers

Published:2003-09 Issue:6 Volume:35 Page:481-483
ISSN:0030-3992
Container-title:Optics & Laser Technology
language:en
Short-container-title:Optics & Laser Technology

Author:

Hu Guijun,Shi Jiawei,Shi Yingxue,Yang Xiaosong,Li Jing

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Extended noise analysis-novel for reliability screening;Hartler;Microelectron Reliab,1998

2. A study of optical noise measurement as a reliability. Estimation for laser diodes;Dai;Microelectron Reliab,1995

3. High-power quantum well remote junction laser and its electrical noise characteristics;Hu;Opt Laser Technol,2001

4. Correlation between the low-frequency electrical noise of high-power quantum well lasers and devices surface non-radiative current;Hu;Microelectron Reliab,2002

5. Electrical noise of laser diodes measured over a wide range of bias currents;Chen;Microelectron Reliab,2000

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Noises and Stability of Semiconductor Lasers;Optical and Fiber Communications Reports;2017

2. Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes;Microelectronics Reliability;2015-08

3. A novel method to estimate the parameters of 1/f noise of semiconductor laser diodes;Acta Physica Sinica;2009

4. Thermal Analysis of InAs Quantum Dot Laser Diodes with an Additional Au Layer on p-Metal;Journal of the Korean Physical Society;2007-06-15

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