Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes-Reference-Cited by-同舟云学术

Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes

Published:2015-08 Issue:9-10 Volume:55 Page:1741-1745
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Del Vecchio P.^ORCID,Curutchet A.,Deshayes Y.,Bettiati M.,Laruelle F.,Labat N.,Béchou L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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