Author:
Yang D.G.,Ernst L.J.,van `t Hof C.,Kiasat M.S.,Bisschop J.,Janssen J.,Kuper F.,Liang Z.N.,Schravendeel R.,Zhang G.Q.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. The quality of die-attachment and its relationship to vertical die cracking;Van Kessel;IEEE Trans. Comp., Hybr., Manufac. Tech.,1983
2. Die cracking in Flip Chip on Board assembly;Hu,1995
3. Die cracking in flip chip assembly;Ranjan,1998
4. Curing shrinkage and residual stress in viscoelastic thermosetting resins and composites;Kiasat,2000
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