The Quality of Die-Attachment and Its Relationship to Stresses and Vertical Die-Cracking-Reference-Cited by-同舟云学术

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The Quality of Die-Attachment and Its Relationship to Stresses and Vertical Die-Cracking

Published:1983-12 Issue:4 Volume:6 Page:414-420
ISSN:0148-6411
Container-title:IEEE Transactions on Components, Hybrids, and Manufacturing Technology
language:en
Short-container-title:IEEE Trans. Comp., Hybrids, Manufact. Technol.

Author:

Kessel C.v.,Gee S.,Murphy J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,General Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx6/33/25313/01136196.pdf?arnumber=1136196

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