Dielectric Reliability Measurement Methods: A Review
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Published:1998-02
Issue:1
Volume:38
Page:37-72
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ISSN:0026-2714
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Container-title:Microelectronics Reliability
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language:en
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Short-container-title:Microelectronics Reliability
Author:
Martin Andreas,O'Sullivan Paula,Mathewson Alan
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference272 articles.
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