Enhanced dielectric reliability in the X9R‐type Bi1/2Na1/2TiO3‐CaZrO3 relaxor ferroelectric ceramics

Abstract

AbstractHigh‐performance dielectric ceramic capacitors for automotive applications require high operation temperature, thermal stability, and reliability for dielectric ceramics. A broad composition search has been carried out to replace the existing BaTiO3‐based dielectrics having limited upper operating temperature due to the relatively low Curie temperature at around 120°C. However, most of the developed compositions are too complicated and compositionally sensitive, making them difficult to commercialize. This study introduces a dielectrically reliable ceramic system based on Bi1/2Na1/2TiO3 (BNT) with a wide operation temperature range simply by adding paraelectric CaZrO3 (CZ). At 15 mol% addition of CZ to BNT, the permittivity variation within ±15% from −55 to 280°C was achieved, which surpasses the EIA‐X9R standard. Moreover, the dielectric reliability was shown with low dielectric loss (tanδ < 0.02) for the aforementioned temperature range and remarkable dielectric breakdown strength (∼260 kV/cm) at room temperature. Along with the proposal of a promising high‐performance dielectric material, structural analysis and dielectric behavior investigation as a function of CZ contents were presented.