Micromachining of diamond probes for atomic force microscopy applications-Reference-Cited by-同舟云学术

Micromachining of diamond probes for atomic force microscopy applications

Published:2001-01 Issue:3 Volume:88 Page:247-255
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Unno Kazuya,Shibata Takayuki,Makino Eiji

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference30 articles.

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4. Magnetic imaging by “force microscopy” with 1000 Å resolution;Martin;Appl. Phys. Lett.,1987

5. Deposition and imaging of localized charge on insulator surfaces using a force microscope;Stern;Appl. Phys. Lett.,1988

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