Author:
Sarro P.M.,deBoer C.R.,Korkmaz E.,Laros J.M.W.
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference8 articles.
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5. Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests;El Khakani;J. Mater. Res.,1994
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62 articles.
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