Automated defect inspection system for CMOS image sensor with micro multi-layer non-spherical lens module-Reference-Cited by-同舟云学术

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Automated defect inspection system for CMOS image sensor with micro multi-layer non-spherical lens module

Published:2017-10 Issue: Volume:45 Page:248-259
ISSN:0278-6125
Container-title:Journal of Manufacturing Systems
language:en
Short-container-title:Journal of Manufacturing Systems

Author:

Jeffrey Kuo Chung-Feng,Lo Wen-Chi,Huang Yan-Ru,Tsai Hsin-Yang,Lee Chi-Lung,Wu Han-Cheng

Funder

Ministry of Science & Technology of the Republic of China

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Hardware and Architecture,Software,Control and Systems Engineering

Reference31 articles.

1. An innovative blemish detection system for curved LED lenses;Chiu;Exp Syst Appl,2013

2. Automatic optical inspection system for IC molding surface;Chen;J Intell Manuf,2016

3. On the detection of defects on specular car body surfaces;Molina;Robot Comput-Integr Manuf,2017

4. Light source optimization for automatic visual inspection of piston surface defects;Xu;Int J Adv Manuf Technol,2017

5. Automatic thresholding for defect detection by background histogram mode extents;Aminzadeh;J Manuf Syst,2015

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