Automatic thresholding for defect detection by background histogram mode extents

Author:

Aminzadeh Masoumeh,Kurfess Thomas

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Hardware and Architecture,Software,Control and Systems Engineering

Reference21 articles.

1. Histogram concavity analysis as an aid in threshold selection;Rosenfeld;Syst., Man Cybern. IEEE Trans.,1983

2. A valley-seeking threshold selection;Sahasrabudhe;Comput. Vision Image Process.,1992

3. Application of artificial neural network to discrimination of defect type in automatic radiographic testing of welds;Aoki;ISIJ Int.,1999

4. Automated visual inspection and Robot vision;Vernon,1991

5. A survey of thresholding techniques;Sahoo;Comput. Vision, Graphics, Image Process.,1988

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