In situ infrared ellipsometry study of the growth of hydrogenated amorphous carbon thin films
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
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5. B. Dischler, P. Koidl, P. Oelhafen, E-MRS Symp. Proc., vol. 17, Les Editions de Physique, Paris, 1987, p. 189.
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