Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry-Reference-Cited by-同舟云学术

Composition and thickness of non-functional organosilane films coated on aluminium studied by means of infra-red spectroscopic ellipsometry

Published:2003-09 Issue:1-2 Volume:441 Page:76-84
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Franquet A,Terryn H,Vereecken J

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. M. Stratman, M. Rohwerder, C. Reinaertz, Ch. Jung, Ch. Bram, In: I. Olefjord, L. Nyborg, D. Briggs (Eds.), Proceedings of the European Conference on Applications of Surface and Interface Analysis (ECASIA), Göteborg, Sweden, June 16–20, 1997, p. 13

2. W.A. Rowland, Lecture Note of Aluminium Leerstoel 1997–1998, Brussels, Belgium, March 25, 1998

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