Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods-Reference-Cited by-同舟云学术

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Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods

Published:1998-12 Issue:1-2 Volume:336 Page:1-8
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Metzger T.H.,Kegel I.,Paniago R.,Lorke A.,Peisl J.,Schulze J.,Eisele I.,Schittenhelm P.,Abstreiter G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. MRS Bulletin, 23(2), February 1998.

2. High-resolution x-ray diffraction from multilayered self-assembled Ge dots

3. Depth‐resolved measurement of lattice relaxation in Ga1−xInxAs/GaAs strained layer superlattices by means of grazing‐incidence x‐ray diffraction

4. Characterization of lateral semiconductor nanostructures by means of x-ray grazing-incidence diffraction

5. Kinetic Roughness of Amorphous Multilayers Studied by Diffuse X-Ray Scattering

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