Kinetic Roughness of Amorphous Multilayers Studied by Diffuse X-Ray Scattering
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.73.2228/fulltext
Reference15 articles.
1. X-ray reflectivity and scanning-tunneling-microscope study of kinetic roughening of sputter-deposited gold films during growth
2. Diffuse scattering of hard x rays from rough surfaces
3. Determination of roughness correlations in multilayer films for x‐ray mirrors
4. X-ray and neutron scattering from rough surfaces
5. X‐ray diffraction measurement of partially correlated interfacial roughness in multilayers
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