Author:
Deferm L.,Simoen E.,Dierickx B.,Claeys C.
Subject
General Physics and Astronomy,General Materials Science
Reference10 articles.
1. Latch up in CMOS technology;Troutman,1986
2. The influence of the drain multiplication current on latch-up behaviour;Deferm;IEEE Trans Elec Dev,1988
3. Operation of bulk CMOS devices at very low temperatures;Hanamura;IEEE J Sol St Circ,1986
4. The charge transport in a silicon resistor at liquid helium temperatures;Simoen;J Appl Phys,1990
5. Analytical model for the current—voltage characteristics of a silicon resistor at liquid helium temperatures;Simoen;Cryogenics,1990
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