Electrical and optical characterizations by prism-coupling method of PZT deposited in-situ by sputtering
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference20 articles.
1. Preparation ofc‐axis oriented PbTiO3thin films and their crystallographic, dielectric, and pyroelectric properties
2. Ferroelectric thin films for electronic applications
3. Optical waveguiding in epitaxial PbTiO_3 thin films
4. Low‐temperaturein situpreparation of ferroelectric Pb(Zr0.55Ti0.45)O3thin films by reactive sputtering
5. In situ deposition of sputtered PZT films: control of the growth temperature by the sputtered lead flux
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. PREPARATION AND CHARACTERIZATIONS OF PbZr0.53Ti0.47O3 THICK FILMS ON LaNiO3 COATED Si BY MODIFIED METALLORGANIC DECOMPOSITION PROCESS;Integrated Ferroelectrics;2006-11
2. Preparation and optical waveguide property of metal alkoxide solution-derived Pb(Zr0.5Ti0.5)O3 thick films;Applied Physics Letters;2004-05-03
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