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Post-process die-level electromagnetic field analysis on microwave CMOS low-noise amplifier for first-pass silicon fabrication success

  • Published:2016-01 Issue: Volume:52 Page:217-227
  • ISSN:0167-9260
  • Container-title:Integration
  • language:en
  • Short-container-title:Integration

Author:

Eshghabadi FarshadORCID,Banitorfian Fatemeh,Mohd Noh Norlaili,Mustaffa Mohd Tafir,Abd Manaf Asrulnizam

Funder

Universiti Sains Malaysia Postgraduate Research Grant Scheme

Exploratory Research Grant Scheme

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference34 articles.

1. P. Viklund. Reducing RF design cycles through improved design methodologies [Online]. Available: 〈www.rfdesign.com〉

2. Computer-aided design of RF and microwave circuits and systems;Steer;Microw. Theory Tech., IEEE Trans.,2002

3. Where did EM simulation tools go?: a comparison of how EM tools were used in circuit simulators 25 years ago to today;Dunn;Microw. Mag., IEEE,2014

4. Matrix methods for field problems;Harrington;Proc. IEEE,1967

5. An electromagnetic time-harmonic analysis of shielded microstrip circuits;Rautio;Microw. Theory Tech., IEEE Trans.,1987

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