A test set embedding approach based on twisted-ring counter with few seeds-Reference-Cited by-同舟云学术

A test set embedding approach based on twisted-ring counter with few seeds

Author:

Zhou Bin,Ye Yi-zheng,Li Zhao-lin,Zhang Jian-wei,Wu Xin-chun,Ke Rui

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference21 articles.

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2. A Novel Test Data Compression Scheme for SoCs Based on Block Merging and Compatibility;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2014