Towards generic charge-pump phase-locked loop, jitter estimation techniques using indirect on chip methods-Reference-Cited by-同舟云学术

Towards generic charge-pump phase-locked loop, jitter estimation techniques using indirect on chip methods

Published:2007-02 Issue:2 Volume:40 Page:133-148
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Burbidge Martin John,Tijou J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference46 articles.

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3. S. Wartenburg, RF micro devices, RF test fixture basics, Microwave J. (2003), www.mwjournal.com, active September 2003.

4. M.J. Burbidge, A. Richardson, Test techniques for embedded charge-pump phase-locked loops; problems, current BIST techniques, and alternative suggestions, in: Seventh IEEE International Mixed Signal Test Workshop, 2001.

5. Noise properties of PLL systems;Kroupa;IEEE Trans. Comm.,1982

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