Interfacial reaction between Sn–Ag–Cu solder and Co–P films with various microstructures
Author:
Publisher
Elsevier BV
Subject
Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference47 articles.
1. Electronics Without Lead
2. Six cases of reliability study of Pb-free solder joints in electronic packaging technology
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4. Current density redistribution from no current crowding to current crowding in Pb-free solder joints with an extremely thick Cu layer
5. Thermal cycling reliability of SnAgCu and SnPb solder joints: A comparison for several IC-packages
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4. IMC Growth and Microstructure Evolution of Co13%P/SAC/Co-13%P Solder Joint under Thermal-Electrical Coupling Fields;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08
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