Author:
Adams J.D.,Manning L.,Rogers B.,Jones M.,Minne S.C.
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Novel optical approach to atomic force microscopy;Meyer;Appl. Phys. Lett.,1988
2. Force microscope with capacitive displacement detection;Goddenhenrich;J. Vac. Sci. Technol. A,1990
3. M. Tortonese, H. Yamada, R. Barrett, C. Quate, Atomic force microscopy using a piezoresistive cantilever, in: The Proceedings of Transducers’91 (IEEE), Pennington, NJ, 1991, Publication no. 91Ch2817-5, p. 448.
4. Atomic resolution with an atomic force microscope using piezoresistive detection;Tortonese;Appl. Phys. Lett.,1993
5. Characterization of sputtered ZnO thin film as sensor and actuator for diamond AFM probe;Shibata;Sens. Actuators A,2002
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24 articles.
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