Field-assisted oxygen etching for sharp field-emission tip
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference24 articles.
1. The Topografiner: An Instrument for Measuring Surface Microtopography
2. Field emission scanning auger microscope (Fesam)
3. Holography with low-energy electrons
4. Reflection shadow imaging of crystal surface by low-voltage point-reflection electron microscopy
5. Low-Energy Electron Diffraction Patterns Using Field-Emitted Electrons from Tungsten Tips
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1. Atom Probe Analysis of Tungsten Tips Fabricated by Field-assisted Oxygen Etching;e-Journal of Surface Science and Nanotechnology;2024-03-02
2. Fabrication of Pt- and Au-coated W Nano Tip with Electroplated Films as a Noble-metal Source toward Viable Application for Long-life Electron Source;e-Journal of Surface Science and Nanotechnology;2021-12-28
3. Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope;ACS Nano;2021-11-15
4. Creation and Characterization of an Atomically Sharp Single/Trimer Atom Ir/W(111) Tip by Thermal Field-Assisted Faceting;Microscopy and Microanalysis;2021-07-23
5. Field Assisted Reactive Gas Etching of Multiple Tips Observed using FIM;Ultramicroscopy;2021-04
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