Field emission scanning auger microscope (Fesam)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference16 articles.
1. Observation of Metal-Vacuum-Metal Tunneling, Field Emission, and the Transition Region
2. The Topografiner: An Instrument for Measuring Surface Microtopography
3. Wide-range, low-operating-voltage, bimorph STM: Application as potentiometer
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