Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope-Reference-Cited by-同舟云学术

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Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope

Published:2021-11-15 Issue:12 Volume:15 Page:19377-19386
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Onoda Jo¹^ORCID,Khademi Ali²,Wolkow Robert A.¹³,Pitters Jason⁴

Affiliation:

1. Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

2. Metrology Research Centre, National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada

3. Quantum Silicon, Inc., Edmonton Alberta T6G 2M9, Canada

4. Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.1c05777

Reference60 articles.

1. Molecule Cascades

2. Electronics using hybrid-molecular and mono-molecular devices

3. Realizing All-Spin–Based Logic Operations Atom by Atom

4. On-Surface Atomic Wires and Logic Gates

5. Binary atomic silicon logic

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomically Precise Manufacturing of Silicon Electronics;ACS Nano;2024-02-20

2. 研究者兼大学教員となって;Vacuum and Surface Science;2023-10-10

3. Temperature Behavior of Silicon Dangling Bond Logic;2023 IEEE 23rd International Conference on Nanotechnology (NANO);2023-07-02

4. The Controllable Synthesis of High‐Quality Two‐Dimensional Iron Sulfide with Specific Phases;Small;2023-03-15

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