Influence of sample charging on satellite spectra during particle induced X-ray emission analysis
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference22 articles.
1. Enhanced X-ray yields in PIXE analysis of some binary metal fluorides
2. The measurement of enhanced PIXE yields with 3He2+ ions
3. PIXE yield enhancement of metal fluorides under bombardment with charged particles
4. A PIXE study of abnormal X-rays from binary fluorides with protons in the range 0.4–2 MeV
5. Strong X-ray emission from electrified material
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1. Application of Pyroelectric Crystal—A Safety X-ray Source;RADIOISOTOPES;2011
2. Strong X-Ray Emission from Electrified Insulators;Analytical Sciences;2005
3. Portable X-ray fluorescence spectrometer with an electric battery;BUNSEKI KAGAKU;2004
4. High-resolution PIXE instrumentation survey. Part II;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04
5. Atomic Spectrometry Updates—References;J. Anal. At. Spectrom.;1996
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