The measurement of enhanced PIXE yields with 3He2+ ions
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference6 articles.
1. Enhanced X-ray yields in PIXE analysis of some binary metal fluorides
2. Proton-induced prompt gamma-ray spectrometry: A survey of its analytical significance and some applications
3. Analytical Application of Proton-induced Prompt Photon Spectrometry;Gihwala,1982
4. Ion beam analytical methods for attempts to establish the provenance of archaeological objects in the absence of reference artefacts
5. Determination of fluorine by the spectrometry of prompt gamma-rays
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Low-energy Ion Induced X-ray Emission from Insulators and Development of an Instrument for its Measurement;e-Journal of Surface Science and Nanotechnology;2006
2. Influence of d.c. bias on characteristic X-ray emission from Al2O3 targets bombarded with 30-keV Ga+ ions;Surface and Interface Analysis;2006
3. Time-resolved measurement of X-ray emission from Al2O3 targets induced by low-energy ion bombardment;Surface and Interface Analysis;2006
4. Improvement in detection limits by using helium ions for particle-induced x-ray emission;X-Ray Spectrometry;2005
5. Differences in PIXE signal-to-noise ratios and detection limits for conducting targets insulated with glass;Journal of Radioanalytical and Nuclear Chemistry;2001
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3