PIXE yield enhancement of metal fluorides under bombardment with charged particles-Reference-Cited by-同舟云学术

PIXE yield enhancement of metal fluorides under bombardment with charged particles

Published:1994-03 Issue:2 Volume:178 Page:387-397
ISSN:0236-5731
Container-title:Journal of Radioanalytical and Nuclear Chemistry Articles
language:en
Short-container-title:Journal of Radioanalytical and Nuclear Chemistry, Articles

Author:

Peisach M.,Pineda C. A.,Pillay A. E.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF02039732.pdf

Reference10 articles.

1. M. PEISACH, A. E. PILLAY, C. A. PINEDA, Nucl. Instrum. Methods, B75 (1993) 14.

2. R. C. M. MBOWENI, C. A. PINEDA, M. PEISACH, A. E. PILLAY, 11th Intern. Conf. on Ion Beam Analysis, Balatonfüred, Hungary, 1993, Paper 2.12, Abstracts.

3. M. PEISACH, C. A. PINEDA, A. E. PILLAY, 11th Intern. Conf. on Ion Beam Analysis, Balatonfüred, Hungary, 1993, Paper 2.4, Abstracts.

4. See for example, J. A. RICHARDS, F. W. SEARS, M. R. WEHR, M. W. ZEMANSKY, Modern College Physics, Addison-Wesley, London, 1970.

5. D. GIHWALA, M. PEISACH, S. Afr. J. Chem., 38 (1985) 181.

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