Optimisation of total-reflection X-ray fluorescence for aerosol analysis
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference27 articles.
1. CXVII. The total reflexion of X-rays
2. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis
3. A method for quantitative X-ray fluorescence analysis in the nanogram region
4. An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level
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