Impact of radiation damage on the photoconductor and photodiode properties of GaN core–shell p–n junction microwires
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Published:2024-11
Issue:
Volume:224
Page:111945
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ISSN:0969-806X
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Container-title:Radiation Physics and Chemistry
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language:en
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Short-container-title:Radiation Physics and Chemistry
Author:
Verheij DirkjanORCID,
Peres Marco,
Alves Luís Cerqueira,
Cardoso Susana,
Alves Eduardo,
Durand Christophe,
Eymery Joël,
Lorenz Katharina