Thick-target correction in PIXE for randomly inhomogeneous samples-Reference-Cited by-同舟云学术

Thick-target correction in PIXE for randomly inhomogeneous samples

Published:2000-03 Issue: Volume:161-163 Page:264-268
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Sjöland K.A.,Munnik F.,Wätjen U.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference3 articles.

1. S.A.E. Johansson, J.L. Campbell, PIXE: A Novel Technique for Elemental Analysis, Wiley, New York, 1988 (ISBN 0-471-92011-8)

2. F. Munnik, Doctoral Thesis, Eindhoven, 1994

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