Utilization of Si wafers as a supporting material for in-vacuum PIXE analysis of aqueous solutions-Reference-Cited by-同舟云学术

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Utilization of Si wafers as a supporting material for in-vacuum PIXE analysis of aqueous solutions

Published:2020-06 Issue: Volume:160 Page:109122
ISSN:0969-8043
Container-title:Applied Radiation and Isotopes
language:en
Short-container-title:Applied Radiation and Isotopes

Author:

Rihawy M.S.,Ahmad M.

Publisher

Elsevier BV

Subject

Radiation

Reference42 articles.

1. Determination of the lower limit of detection;Anderson;Clin. Chem.,1989

2. PIXE and XRF analysis of honey samples;Braziewicz;Nucl. Instrum. Methods Phys. Res. Sect. B Beam Interact. Mater. Atoms,2002

3. The GUPIXWIN Manual and User-Guide (V 1.3);Campbell,2005

4. Particle induced X-ray emission (PIXE);Campbell,2009

5. The Guelph PIXE software package IV;Campbell;Nucl. Instrum. Methods Phys. Res. B,2010

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