Author:
Banks J.C.,Doyle B.L.,Knapp J.A.,Werho D.,Gregory R.B.,Anthony M.,Hurd T.Q.,Diebold A.C.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
13 articles.
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1. Heavy-Ion Backscattering Spectrometry;Characterization of Materials;2012-10-12
2. Surface erosion induced by heavy ion backscattering analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-12
3. Surface and Thin-Film Analysis, 3. Ion Detection;Ullmann's Encyclopedia of Industrial Chemistry;2011-10-15
4. Rutherford Backscattering Spectroscopy (RBS);Surface and Thin Film Analysis;2011-04-12
5. TOF-RBS with medium energy heavy ion probe for semiconductor process analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06