Thin silicon strip devices for direct electron detection in transmission electron microscopy-Reference-Cited by-同舟云学术

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Thin silicon strip devices for direct electron detection in transmission electron microscopy

Published:2008-06 Issue:1 Volume:591 Page:134-137
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Moldovan Grigore,Li Xiaobing,Wilshaw Peter,Kirkland Angus

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference3 articles.

1. Transmission Electron Microscopy: A Textbook for Materials Science;Williams,1996

2. Monte Carlo Modelling for Electron Microscopy and Microanalysis;Joy,1995

3. Characterisation of the signal and noise transfer of CCD cameras for electron detection

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1. Double‐sided transistor device processability of carrierless ultrathin silicon wafers;InfoMat;2020-02-04

2. Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor;Microscopy;2014-01-08

3. Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector;Ultramicroscopy;2009-08

4. Imaging modes for direct electron detection in TEM with column parallel CCD;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2009-08

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