Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector-Reference-Cited by-同舟云学术

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Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector

Published:2009-08 Issue:9 Volume:109 Page:1144-1147
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

McMullan G.,Faruqi A.R.,Henderson R.,Guerrini N.,Turchetta R.,Jacobs A.,van Hoften G.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. G. McMullan, A.R. Faruqi, R. Henderson, N. Guerrini, R. Turchetta, A. Jacobs, G. van Hoften, EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, vol. 1, 2008, pp. 73–74.

2. Direct electron imaging in electron microscopy with monolithic active pixel sensors

3. Thin silicon strip devices for direct electron detection in transmission electron microscopy

4. Direct single electron detection with a CMOS detector for electron microscopy

5. Electronic detectors for electron microscopy

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