Sputter ion source cathode pit reconstruction by stylus profilometer, optical techniques and X-ray micro computed tomography-Reference-Cited by-同舟云学术

Sputter ion source cathode pit reconstruction by stylus profilometer, optical techniques and X-ray micro computed tomography

Published:2022-09 Issue: Volume:1039 Page:167016
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Lobanov Nikolai R.,Tunningley Thomas,Linardakis Peter

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. A review of negative ion sources;Middleton;Nucl. Instrum. Methods,1984

3. Sputter-pits casting to measure AMS sample consumption;Shanks;Nucl. Instrum. Methods Phys. Res. Sect. B,2015

5. Application of microCT to the non-destructive testing of an additive manufactured titanium component;du Plesis,2015

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