Multi-scale analysis of high precision surfaces by Stylus Profiler, Scanning White-Light Interferometry and Atomic Force Microscopy
Author:
Publisher
Inderscience Publishers
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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