Primary single event effect studies on Xilinx 28-nm System-on-Chip (SoC)-Reference-Cited by-同舟云学术

Primary single event effect studies on Xilinx 28-nm System-on-Chip (SoC)

Published:2016-09 Issue: Volume:831 Page:339-343
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Zhang Yao,Liu Shuhuan,Du Xuecheng,Yuan Yuan,He Chaohui,Ren Xiaotang,Du Xiaozhi,Li Yonghong

Funder

NSFC

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

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4. Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07