Tests of a backside illuminated monolithic CMOS pixel sensor in an HPD set-up-Reference-Cited by-同舟云学术

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Tests of a backside illuminated monolithic CMOS pixel sensor in an HPD set-up

Published:2005-07 Issue:1-2 Volume:546 Page:274-280
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Dulinski Wojciech,Braem Andrea,Caccia Massimo,Claus Gilles,Deptuch Grzegorz,Grandjean Damien,Joram Christian,Séguinot Jacques,Winter Marc

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. A monolithic active pixel sensor for charged particle tracking and imaging using standard VLSI CMOS technology

2. Particle tracking using CMOS monolithic active pixel sensor

3. Design and testing of monolithic active pixel sensors for charged particle tracking

4. Test results of monolithic active pixel sensors for charged particle tracking

5. Development of monolithic active pixel sensors for charged particle tracking

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2. Backside Illuminated 3-D Photosensitive Thin-Film Transistor on a Scintillating Glass Substrate for Indirect-Conversion X-Ray Detection;IEEE Electron Device Letters;2020-08

3. Simulation of the Electrostatic Distribution in the Proximity Focusing Structure of an EBCMOS;IEEE Photonics Journal;2020-06

4. Plan View and Cross-Sectional View EBIC Measurements: Effect of e-Beam Injection Conditions on Extracted Minority Carrier Transport Properties;IEEE Transactions on Electron Devices;2014-07

5. Direct Detection of 100–5000 eV Electrons With Delta-Doped Silicon CMOS and Electron-Multiplying CCD Imagers;IEEE Transactions on Electron Devices;2012-07

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