Author:
Wen Yun-Che,Lee Kuen-Jong
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference16 articles.
1. A BIST scheme for an SNR test of a Sigma-Delta ADC;Toner;IEEE Int. Test Conf.,1993
2. A built-in self-test for ADC and DAC in a single-chip speech CODEC;Teraoka;IEEE Int. Test Conf.,1993
3. BIST for D/A and A/D converters;Arabi;IEEE Design Test Comput.,1996
4. On chip testing data converters using static parameters;Sawan;IEEE Trans. VLSI Syst.,1998
5. A simplified polynomial-fitting algorithm for DAC and ADC BIST;Sunter;IEEE Int. Test Conf.,1997
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2 articles.
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