Author:
Teraoka E.,Kengaku T.,Yasui I.,Ishikawa K.,Matsuo T.,Wakada H.,Sakashita N.,Shimazu Y.,Tokuda T.
Cited by
22 articles.
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1. A BIST Scheme for Dynamic Comparators;Electronics;2022-12-13
2. Current Testable Design of Resistor String DACs;16th Asian Test Symposium (ATS 2007);2007-10
3. Code-Width Testing-Based Compact ADC BIST Circuit;IEEE Transactions on Circuits and Systems II: Express Briefs;2004-11
4. Implementation of a BIST scheme for ADC test;2003 5th International Conference on ASIC Proceedings (IEEE Cat No 03TH8690) ICASIC-03;2003
5. Analog built-in saw-tooth generator for ADC histogram test;Microelectronics Journal;2002-10