Characterisation of porous silicon layers by spectroscopic ellipsometry
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Biochemistry,General Chemistry,Atomic and Molecular Physics, and Optics,Biophysics
Reference22 articles.
1. Study of the optical transitions in poly- and micro-crystalline Si by spectroscopic ellipsometry
2. Design of a compact uniaxial stress apparatus for optical measurements
3. Effect of Pressure on Interband Reflectivity Spectra of Germanium and Related Semiconductors
4. Precision Bounds to Ellipsometer Systems
5. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ellipsometry of Silica Nanoparticulate Langmuir−Blodgett Films for the Verification of the Validity of Effective Medium Approximations;Langmuir;2006-09-01
2. Optical Characterization of Porous Materials;physica status solidi (a);2001-03
3. ELLIPSOMETRIC CHARACTERIZATION OF THIN FILMS;Handbook of Surfaces and Interfaces of Materials;2001
4. Ellipsometric characterization of oxidized porous silicon layer structures;Materials Science and Engineering: B;2000-01
5. Optical properties of Si nanocomposite films prepared by laser ablation;Thin Solid Films;1999-07
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