Ellipsometry of Silica Nanoparticulate Langmuir−Blodgett Films for the Verification of the Validity of Effective Medium Approximations

Author:

Nagy Norbert1,Deák András1,Hórvölgyi Zoltán1,Fried Miklós1,Agod Attila1,Bársony István1

Affiliation:

1. Research Institute for Technical Physics and Materials Science (MFA), P. O. Box 49, H-1525 Budapest, Hungary, Department of Physical Chemistry, Budapest University of Technology and Economics, H-1521 Budapest, Hungary, and Department of Nanotechnology, Pannon University, H-8200 Veszprém, Hungary

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

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