Study of the optical transitions in poly- and micro-crystalline Si by spectroscopic ellipsometry
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference37 articles.
1. Tetrahedrally-Bonded Amorphous Semiconductors,1985
2. Structural studies of low‐temperature low‐pressure chemical deposited polycrystalline silicon
3. Pressure dependence of the growth of polycrystalline silicon by low-pressure chemical-vapor deposition
4. The one phonon Raman spectrum in microcrystalline silicon
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