In-situ ellipsometric studies on epitaxially grown silicon by hot-wire CVD
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference20 articles.
1. Low Temperature Silicon Epitaxy by Partially Ionized Vapor Deposition
2. Ion beam epitaxy of silicon on Ge and Si at temperatures of 400 K
3. Epitaxial growth of silicon by photochemical vapor deposition at a very low temperature of 200 °C
4. Very low temperature (250 °C) epitaxial growth of silicon by glow discharge of silane
5. Study on further reducing the epitaxial silicon temperature down to 250 °C in low‐energy bias sputtering
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2. The epitaxial growth of sputtered silicon layers on differently oriented substrates at low temperature – An electron microscopic study;Journal of Non-Crystalline Solids;2007-08
3. Low-temperature silicon homoepitaxy by hot-wire chemical vapor deposition with a Ta filament;Journal of Crystal Growth;2006-01
4. Roughness, impurities and strain in low-temperature epitaxial silicon films grown by tantalum filament hot-wire chemical vapor deposition;MRS Proceedings;2006
5. Monitoring and modeling silicon homoepitaxy breakdown with real-time spectroscopic ellipsometry;Journal of Applied Physics;2005-05-15
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