Correction of the field distortion in embedded laser marking system
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
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2. High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model;Lin;Optics & Laser Technology,2011
3. Correction of the image distortion for laser galvanometric scanning system;Xie;Optics & Laser Technology,2005
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5. Distortion and compensation in two dimensions galvanometer optical scanning system;Yan;Applied Laser,1990
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