High precision wavefront correction method in interferometer testing

Author:

Wu Lunzhe1,Zhao LiangxiaoORCID,Fang Yuanyuan,Walker David2,Yu Guoyu2,Li Hongyu2,Bu YangORCID

Affiliation:

1. University of Chinese Academy of Sciences

2. University of Huddersfield

Abstract

A wavefront correction method is proposed for high-precision optic surfacing, addressing the discrepancy between wavefront and real surface errors in Fizeau interferometer testing. We believe this to be a proposed novel method that encompasses optical surface function parameters fitting, lateral distortion correction, misalignment error removal, and sag surface error calculation. The method's error has been thoroughly analyzed, including aspects of function parameters fitting, ray tracing, and interpolation. The effectiveness of the method was demonstrated by correcting the wavefront of an off-axis parabolic mirror in null testing configurations, significantly reducing artificially created annular errors and improving off-axis direction errors from 0.23λ to 0.05λ (λ=632.8 nm), with the PV of aspheric departures exceeding 8.5 mm.

Funder

Opening project of the Anhui Province Key Laboratory of Non-Destructive Evaluation

National Key Research and Development Program of China

Publisher

Optica Publishing Group

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