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High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model

  • Published:2011-02 Issue:1 Volume:43 Page:218-225
  • ISSN:0030-3992
  • Container-title:Optics & Laser Technology
  • language:en
  • Short-container-title:Optics & Laser Technology

Author:

Lin Chern-Sheng,Tsung Huang Jui,Wei Tzu-Chi,Yeh Mau-Shiun,Chen Der-Chin

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Laser beam machining—A review;Dubey;International Journal of Machine Tools and Manufacture,2008

2. An investigation into characterizing and optimizing laser cutting quality — A review;Pietro;International Journal of Machine Tools and Manufacture,1994

3. An evaluation of surface roughness parameters measurement using vision-based data;Kindi;International Journal of Machine Tools and Manufacture,2007

4. Sensing, modeling and control for laser-based additive manufacturing;Hu;International Journal of Machine Tools and Manufacture,2003

5. A new calibration model of camera lens distortion;Wang;Pattern Recognition,2008
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