Evaluation of activation energy by means of different trap spectroscopy techniques-Reference-Cited by-同舟云学术

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Evaluation of activation energy by means of different trap spectroscopy techniques

Published:1980-05 Issue:6 Volume:34 Page:419-422
ISSN:0038-1098
Container-title:Solid State Communications
language:en
Short-container-title:Solid State Communications

Author:

Balarin M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,General Chemistry

Reference14 articles.

1. Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments

2. High-Field Isothermal Currents and Thermally Stimulated Currents in Insulators Having Discrete Trapping Levels

3. Fast capacitance transient appartus: Application to ZnO and O centers in GaP p‐n junctions

4. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. References;Thermally and Optically Stimulated Luminescence;2011-03-28

2. A new method for the analysis of thermally stimulated current data;Physica Status Solidi (a);1981-05-16

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